1) explain what the effect of a non-random powder sample would be on the diffractogram?

2.how can you explain intensity rations in your samples which differ from the ICDD?

3.what would changing the scan speed achieve,and why may you want to do this ?

 

this topics are belongs to XRPD.      not so long in sort  with detail information. with refernces  

A non-random powder sample would not produce a diffractogram with the same intensities as a random powder sample. The peaks on a diffractogram identify the crystalline phases in a powder sample, so the relative intensities of the peaks can be used to characterize the sample. A non-random powder sample would have a different distribution of crystalline phases than a random powder sample, so the relative intensities of the peaks would be different. This would make it difficult to accurately characterize the sample using the diffractogram. For example, if a sample contained only one crystalline phase, the peak for that phase would be much stronger than the peaks for any other phase present in the sample. This would make it difficult to accurately identify the other phases in the sample. 
 

How to explain intensity rations in your samples which differ from the ICDD

The relative intensities of the peaks in a diffractogram depend on the distribution of crystalline phases in the powder sample. The ICDD database contains diffractograms for random powder samples, so the relative intensities of the peaks in a diffractogram from that database can be used to compare the intensity ratios of peaks in other diffractograms. If the distribution of crystalline phases in a powder sample is not random, the relative intensities of the peaks will be different than the relative intensities in the ICDD database. This can make it difficult to accurately compare the intensity ratios of peaks in different diffractograms. 
 

What would changing the scan speed achieve,and why may you want to do this ?

Changing the scan speed can affect the intensity of the peaks in a diffractogram. The peaks in a diffractogram are due to the diffraction of X-rays from the crystalline phases in a powder sample. The intensity of a peak is proportional to the amount of X-ray radiation that is diffracted by the phase. The scan speed affects the amount of time that the X-rays have to interact with the sample. A faster scan speed will cause the X-rays to interact with the sample for a shorter time, so the intensity of the peaks will be lower. A slower scan speed will cause the X-rays to interact with the sample for a longer time, so the intensity of the peaks will be higher. 
Scanning speed affects the resolution of the diffractogram. The higher the scan speed, the higher the resolution. This means that the peaks on the diffractogram will be narrower, and the diffractogram will be less noisy. This can be useful for accurately identifying the peaks in a diffractogram and measuring the intensities of the peaks. 
 

Step-by-step explanation

A diffractogram is a graphical representation of the diffraction pattern of a material. It shows the angular distribution of the diffracted light as a function of the diffraction angle. 
 

The International Centre for Diffraction Data (ICDD) is a not-for-profit scientific organization that promotes and facilitates the exchange of scientific information on crystals and other materials. The ICDD operates the world's largest collection of crystal diffraction and powder diffraction data. 
 

X-ray powder diffraction (XRPD) is a scientific technique used to determine the crystalline structure of a material. This is done by firing an X-ray beam at the material and then analyzing the diffraction pattern that is created.